A course covering both introductory and advanced topics in electron microscopy, including transmission electron microscopy, scanning electron microscopy and focused ion beam and related spectroscopy techniques, i.e., energy dispersive X-ray spectroscopy and electron energy-loss spectroscopy.

The course is designed for those interested in electron microscopy (far-fields): graduate students with a bachelor degree in engineering or science; fourth-year undergraduates majored in science or engineering fields.