A course covering both introductory and advanced topics in electron microscopy, including transmission electron microscopy, scanning electron microscopy and focused ion beam and related spectroscopy techniques, i.e., energy dispersive X-ray spectroscopy and electron energy-loss spectroscopy.
The course is designed for those interested in electron microscopy (far-fields): graduate students with a bachelor degree in engineering or science; fourth-year undergraduates majored in science or engineering fields.
School of Graduate Studies University of Toronto 63 St. George Street Toronto, ON Canada M5S 2Z9 Calendar Contacts |
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